TM 32-5811-025-14&P
1-3. Destruction of Army Materiel To Prevent Enemy Use.
Procedures for the destruction of Army materiel are contained in TM 750-244-2, Procedures for Destruction of
Electronics Materiel To Prevent Enemy Use (Electronics Command).
1-4. Administrative Storage.
Refer to TM 740-90-1, Administrative Storage of Equipment, for test: procedures, forms and records, and
inspections required during administrative storage of this equipment.
1-5. Reporting of Errors.
The reporting of errors, omissions, and recommendations for improving this publication by the individual user is
encouraged. Reports should be submitted on DA Form 2028 (Recommended Changes to Publications) and forwarded
directly to the Commander, U.S. Army Electronic Materiel Readiness Activity, Vint Hill Farms Station, Warrenton,
Virginia 22186, Attn: SELEM-ME-E.
1-6. Reporting Equipment Improvement Recommendations (EIR).
EIRs will be submitted on SF 368 (Quality Deficiency Report) in accordance with TM 38-750 (TAMMS). EIRs
should be mailed directly to the Commander, U.S. Army Electronic Materiel Readiness Activity, Vint Hill Farms Station,
Warrenton, Virginia 22186, Attn: SELEM-ME-I. A reply will be furnished directly to you.
Section II. DESCRIPTION AND DATA
1-7. Purpose and Use.
The purpose of the RF processor test set is to test radio frequency (RF) processor units, which contain digitally
selectable transmission line-type delay elements.
In a typical application (see figure 1-2), the RF processor test set receives 115-V ac power from an external
source. In turn, the RF processor test set supplies all required ac and dc power for the RF processor. The RF processor
test set also generates the digital command word that controls the RF processor. Desired RF processor switching or
delay settings are selected using the RF processor test set's front-panel switches. In addition, the RF processor test set
receives an input signal from an external RF signal generator and provides four df baseline RF outputs to the RF
processor. The RF signals are routed through the various RF circuits of the RF processor. An RF power meter is used at
the RF processor df or intercept output to measure the overall insertion loss between the RF processor inputs and
outputs.
1-2
