TM 32-5811-025-14&P
Table 3-1. RF Processor Test Set Controls, Indicators,
and Connectors - Continued
Control, indicator, or connector
Function
S1
Down - Sets AS1 of the antenna switching
command LOW.
Up - Sets AS1 of the antenna switching
command HIGH.
MODULATION
Down - Sets the RF processor MODULATION
(toggle switch)
switch LOW.
Up - Sets the RF processor MODULATION
switch HIGH.
BITE
Down - Turns off (DISABLE) the RF
(toggle switch)
processor internal BITE signal source.
Up - Turns on (ENABLE) the RF processor
internal BITE signal source.
PROC
Down - Turns off (DISABLE) the RF
(Toggle switch)
processor.
Up - Turns on (ENABLE) the RF processor.
TEST MODE
Down - Places the RF processor test set
(toggle switch)
in the DIAGNOSTIC mode. The DIAGNOSTIC
TEST switches are enabled and the
VERIFICATION TEST switch is disabled.
Up - Places the RF processor test set in
the VERIFY mode. The VERIFICATION TEST
switch is enabled and the DIAGNOSTIC
TEST switches are disabled.
VERIFICATION TEST-TEST SELECT
Position 1 - Causes the RF processor test
(rotary switch)
set to adjust the delay line setting of
the RF processor to 000 bits. The RF pro-
cessor selects 000 bit delay line offset
in the RF processor test set. The RF
processor MODULATION switch is set HIGH,
and the df and intercept amplifiers are
inserted.
Position 2 - Same as position 1 except
that the RF processor MODULATION switch
is set LOW.
3-3
