TM 11 5895-1096-40
(a) If GOOD, go to step d.
(b) If DEFECTIVE, replace.
(2)
If INCORRECT, repair wiring/replace defec-
tive connector.
d.
Defective BNC connector on probe
d. Remove probe and top cover from amplifier (para
amplifier.
3-16). Using Multimeter AN/USM-223 check for
continuity from center conductors of BNC connec-
tors to their circuit card tiepoints.
(1) If CORRECT, go to e below.
(2)If INCORRECT, repair wiring/replace defective
connector.
e.
Defective probe amplifier circuit
e. Set up test equipment as shown in figure 3-5 and
card.
perform the following tests:
(1)
Defective input circuit.
(1) Using Oscilloscope OS-262P/U, connect CHI
probe to input tie point and observe waveform as
shown in figure 3-2 (h) of 19.25 MHz @ 0.5 mV
p-p.
(2)
Defective output circuit.
(2) Using Oscilloscope OS-262P/U, connect CHI
probe to output tiepoint and observe waveform
as shown in figure 3-2(h) of 19.25 MHz @ 30 to
40 mV p-p.
(a) If CORRECT, reassemble probe.
(a) If INCORRECT, repair wiring, go to test (3).
(3)
Defective circuit card com-
(3) Using Osciloscope OS-262P/U, trace 19.25 MHz
ponent.
signal through L3, Q2, Ql, RI, and LI-CI stages.
(a) If CORRECT, adjust Ll and L2 for maxi-
mum gain.
(b) If INCORRECT, replace defective com-
ponent.
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