TM 11 5895-1096-40
CHAPTER 3
MAINTENANCE INSTRUCTIONS
Section I. GENERAL
m. Repainting and Refinishing (para 3-19).
3-1. Scope of General Support Maintenance
n. Reassembly (para 3-20).
This chapter contains the following general support
o. Testing Procedures (sect. V).
maintenance functions for the test set:
bench testing,
(1) General (para 3-21).
troubleshooting,
voltage
measurements,
(2) Physical tests and inspection (para 3-22).
measurements, continuity measurements, disassembly,
(3) TS-3566/GRA-114performancetest(para3-23).
cleaning, initial inspection, repair and replacement,
(4) 19.25MHzamplifierperformancetest(para3-24).
reassembly, repainting and refinishing, and general support
performance testing procedures.
The general support
3-3. Voltage Measurements
maintenance procedures supplement the maintenance
WARNINGS
procedures contained in TM 11-5895-1096-12.
When making voltage measurements on
this equipment, be extremely careful. 120
3-2. Organization of General
volts AC is present in the power supply
Support Maintenance
circuit. DEATH ON CONTACT may result
General support maintenance procedures are listed below,
if safety precautions are not followed. Do
together with references to the paragraphs covering the
not make internal connections alone.
specific maintenance function.
Always have another person to help in
a. Voltage Measurements (para 3-3).
case of an accident.
(1) General.
Always disconnect the AC source, and
(2) Main assembly.
ground the part with a shorting stick
(3) Probe amplifier assembly.
before making resistance measurements.
b. Waveform Measurements (para 3-4).
c. Continuity Measurements (para 3-5).
CAUTION
d. Bench Tests (para 3-6).
This
equipment
is
transistorized:
(1) General.
observe all cautions to prevent transistor
(2) Main assembly.
damage. Do not make continuity checks
(3) Probe amplifier assembly.
other than those specified in the tables.
e. Test Set Troubleshooting (sect. III).
Damage
to
the
transistors
and
(1) General troubleshooting information (para 3-9).
(2) Troubleshooting procedures (para 3-10).
microelectronic devices, which can
(a) General.
impair the performance of the equipment,
(b) Voltage measurements.
may result if improper battery voltages
(c) Intermittent troubles.
and polarities are applied.
(d) Test points.
a. General. This equipment is transistorized. Observe
(3) Troubleshooting tables (para 3-11).
all cautions to prevent transistor damage. Make voltage
(a) General.
measurements in this equipment only as specified. When
(b) Main assembly and probe amplifier.
measuring voltages, use tape or sleeving to insulate the entire
(c) Encode generator circuit card.
test prod, except for the extreme tip. A momentary short
circuit can ruin a transistor. (For example, if the bias is
f.
Maintenance of Test Set (para 3-12).
shorted out, excessive current would ruin the transistor
g.
Inspection (para 3-13).
between the emitter and the base.) Use all referenced
h.
Cleaning (para 3-14).
diagrams as an aid when making voltage and resistance
i.
General Repair Procedures (para 3-15).
measurements.
j.
Disassembly (para 3-16).
b. Test Set Main Assembly.
To perform voltage
k.
Parts Replacement (para 3-17).
measurements on the main assembly it must be disassembled
l.
Circuit Card Repairs (para 3-18).
which are the resistor and capacitor color codes, schematic
and wiring diagrams.
3-1
