TM 32-5811-025-14&P
Section V. INTERMEDIATE SUPPORT TEST PROCEDURES
6-9. General.
This section provides intermediate support test procedures for the RF processor test set. The test procedures
indicate whether a new or repaired unit is capable of performing its assigned mission.
6-10. Test Procedures.
WARNING
High voltage is used in the operation of this equipment. Avoid contacting high-voltage
connections when installing or operating this equipment. Injury or death may result if personnel
fail to observe safety precautions.
Three test procedures are used to verify the proper functioning and calibration of the RF processor test set. They
are the control signal test, RF loss calibration test, and the power supply output voltage test.
Equipment test setups in the following figures (see figures 6-1 thru 6-4) use the special test equipment cables
(indicated by WXXX), standard coaxial test cables (such as RG58/U with appropriate connectors or adapters), and
flexible meter leads as required.
a. Control Signal Test. This test checks the proper operation of the command-generating circuitry of the RF
processor test set. To perform the test, proceed as follows:
(1) Connect RF processor test set as shown in figure 6-1. Connect channel 1 of oscilloscope to pin 5 of J6,
and connect channel 2 of oscilloscope to pin 10 of J6 (positive trigger channel 1, negative trigger channel
2).
(2) Push POWER ON push-button of RF processor test set to on position (lamp lights). Verify that DATA
CLOCK OUT and DATA STROBE OUT signals appear as shown in figure 6-2 waveforms A and B.
(3) Set TEST MODE switch to DIAGNOSTIC position. Set DIAGNOSTIC TEST switches to HIGH position
(BITE should be set to ENABLE). Connect oscilloscope channel 1 to pin 7 of J6 and verify that waveform
shown on oscilloscope is the same as waveform C in figure 6-2.
(4) Set DIAGNOSTIC TEST PROC switch to DISABLE position and verify that oscilloscope waveform is the
same as waveform shown in figure 6-2.
Change 1 6-6
