TM 32-5811-025-14&P
(5) Set all DIAGNOSTIC TEST switches LOW, and verify that oscilloscope waveform is the same as
waveform E shown in figure 6-2.
(6) Connect oscilloscope channel 1 probe to RF processor test set connector J6 pin 3. Alternately set
MODULATION switch HIGH and LOW. Verify that oscilloscope shows a positive dc level greater than 2 V
with MODULATION switch HIGH and a dc level of less than 0.8 V with MODULATION switch LOW.
(7) Connect oscilloscope channel 1 probe to RF processor test set connector J6 pin 7. Set RF processor test
set VERIFICATION TEST rotary switch to position 1. Set DIAGNOSTIC TEST switches as shown in table
Verify that oscilloscope waveforms for the two positions are identical.
(8) Repeat step (7) for VERIFICATION TEST rotary switch positions 2 thru 8.
(9) Connect channel 1 of oscilloscope to RF processor test set connector J6 pin 3. Set VERIFICATION TEST
rotary switch to position 1, and set TEST MODE toggle switch to VERIFY. Verify that oscilloscope
waveform agrees with logic state indicated in table 6-3 for rotary switch position 1.
(10) Repeat step (9) for VERIFICATION TEST rotary switch positions 2 thru 8.
b. RF Loss Calibration Test. This test measures the RF signal loss of each test set internal delay reference path.
To perform the test, proceed as follows:
(1) Connect PRF processor test set as shown in figure 6-3.
(2) Set RF signal generator to output a 20-MHz signal at a 0-dBm level.
(3) Connect RF power meter to RF processor test set connector J1, and measure RF output power level. The
level should be as indicated in table 6-4.
(4) Repeat step (3) using connector J2 instead of J1.
(5) Repeat step (3) using connector J3 instead of J1.
(6) Repeat step (3) using connector J4 instead of J1.
6-8
